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Learning to Draw Samples with Amortized Stein Variational Gradient Descent

Conference Paper Poster Spotlights 1 Artificial Intelligence · Machine Learning · Uncertainty in Artificial Intelligence

Abstract

We propose a simple algorithm to train stochastic neural networks to draw samples from given target distributions for probabilistic inference. Our method is based on iteratively adjusting the neural network parameters so that the output changes along a Stein variational gradient direction (Liu & Wang, 2016) that maximally decreases the KL divergence with the target distribution. Our method works for any target distribution specified by their unnormalized density function, and can train any black-box architectures that are differentiable in terms of the parameters we want to adapt. We demonstrate our method with a number of applications, including variational autoencoder (VAE) with expressive encoders to model complex latent space structures, and hyper-parameter learning of MCMC samplers that allows Bayesian inference to adaptively improve itself when seeing more data.

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Context

Venue
Conference on Uncertainty in Artificial Intelligence
Archive span
1985-2025
Indexed papers
3717
Paper id
890392021876389918
v2026.09.13