STOC 2017
Randomized polynomial time identity testing for noncommutative circuits
Abstract
In this paper we show that black-box polynomial identity testing for noncommutative polynomials f ∈𝔽⟨ z 1 , z 2 ,…, z n ⟩ of degree D and sparsity t , can be done in randomized ( n ,log t ,log D ) time. As a consequence, given a circuit C of size s computing a polynomial f ∈𝔽⟨ z 1 , z 2 ,…, z n ⟩ with at most t non-zero monomials, then testing if f is identically zero can be done by a randomized algorithm with running time polynomial in s and n and log t . This makes significant progress on a question that has been open for over ten years. Our algorithm is based on automata-theoretic ideas that can efficiently isolate a monomial in the given polynomial. In particular, we carry out the monomial isolation using nondeterministic automata.
Authors
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Context
- Venue
- ACM Symposium on Theory of Computing
- Archive span
- 1969-2025
- Indexed papers
- 4364
- Paper id
- 855483374360048015