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NeurIPS 2025

YEAST: Yet Another Sequential Test

Conference Paper Main Conference Track Artificial Intelligence ยท Machine Learning

Abstract

The online evaluation of machine learning models is typically conducted through A/B experiments. Sequential statistical tests are valuable tools for analysing these experiments, as they enable researchers to stop data collection early without increasing the risk of false discoveries. However, existing sequential tests either limit the number of interim analyses or suffer from low statistical power. In this paper, we introduce a novel sequential test designed for the continuous monitoring of A/B experiments. We validate our method using semi-synthetic simulations and demonstrate that it outperforms current state-of-the-art sequential testing approaches. Our method is derived using a new technique that inverts a bound on the probability of threshold crossing, based on a classical maximal inequality.

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Keywords

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Context

Venue
Annual Conference on Neural Information Processing Systems
Archive span
1987-2025
Indexed papers
30776
Paper id
697339569516347522