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IROS 1998

Tele-nanorobotics using atomic force microscope

Conference Paper Accepted Paper Artificial Intelligence ยท Robotics

Abstract

A tele-nanorobotics system using an atomic force microscope (AFM) as the nanorobot has been proposed. Modeling and control of the AFM cantilever, and modeling of nanometer scale forces have been realized for telemanipulation applications. Besides 3-D virtual reality visual feedback in the user interface, a 1 DOF haptic device has been constructed for nano scale haptic sensing. For feeling the nano forces, a bilateral teleoperation control system with virtual impedance approach has been introduced. Initial experiments and simulations on the AFM and teleoperation system show that the system can be utilized for different tele-nanomanipulation applications such as 2-D nano particle assembly or biological object manipulation.

Authors

Keywords

  • Atomic force microscopy
  • Nanobioscience
  • Force control
  • Haptic interfaces
  • Virtual reality
  • Feedback
  • User interfaces
  • Control systems
  • Impedance
  • Biological system modeling
  • Hysteresis
  • Flat Surface
  • Linear Scale
  • Inertial Forces
  • Visual Feedback
  • Repulsive Forces
  • Intermolecular Forces
  • Friction Force
  • Contact Region
  • Electrical Noise
  • Force Feedback
  • Contact Model
  • Ideal Response
  • Cantilever Tip
  • Cantilever Deflection
  • Nonlinear Scaling
  • Teleoperation System
  • Nanoworld
  • Nanorobots
  • Nanoscale
  • Tapping Mode
  • Spherical Tip
  • Scale Effect
  • Electrostatic Forces

Context

Venue
IEEE/RSJ International Conference on Intelligent Robots and Systems
Archive span
1988-2025
Indexed papers
26578
Paper id
188726302994594336