Talk, Snap, Complain: Validation-Aware Multimodal Expert Framework for Fine-Grained Customer Grievances

Existing approaches to complaint analysis largely rely on unimodal, short-form content such as tweets or product reviews. This work advances the field by leveraging multimodal, multi-turn customer support dialogues—where users often share both textual complaints and visual evidence (e.g., screenshots, product photos)—to enable fine-grained classification of complaint aspects and severity. We introduce VALOR, a Validation-Aware Learner with Expert Routing, tailored for this multimodal setting. It employs a multi-expert reasoning setup using large-scale generative models with Chain-of-Thought (CoT) prompting for nuanced decision-making. To ensure coherence between modalities, a semantic alignment score is computed and integrated into the final classification through a meta-fusion strategy. In alignment with the United Nations Sustainable Development Goals (UN SDGs), the proposed framework supports SDG 9 (Industry, Innovation and Infrastructure) by advancing AI-driven tools for robust, scalable, and context-aware service infrastructure. Further, by enabling structured analysis of complaint narratives and visual context, it contributes to SDG 12 (Responsible Consumption and Production) by promoting more responsive product design and improved accountability in consumer services. We evaluate VALOR on a curated multimodal complaint dataset annotated with fine-grained aspect and severity labels, showing that it consistently outperforms baseline models, especially in complex complaint scenarios where information is distributed across text and images. This study underscores the value of multimodal interaction and expert validation in practical complaint understanding systems.

Authors

• Rishu Kumar Singh Indian Institute of Technology Patna
• Navneet Shreya National Institute of Technology Patna
• Sarmistha Das Indian Institute of Technology Patna
• APOORVA SINGH
• Sriparna Saha Department of Computer Science And Engineering, Indian Institute of Technology Patna, India

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