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AAAI 2025

Biased Incomplete Multi-View Learning

Conference Paper AAAI Technical Track on Machine Learning I Artificial Intelligence

Abstract

Considering the ubiquitous phenomenon of missing views in multi-view data, incomplete multi-view learning is a crucial task in many applications. Existing methods usually follow an impute-then-predict strategy for handling this problem. However, they often assume that the view-missing patterns are uniformly random in multi-view data, which does not agree with real-world scenarios. In practice, view-missing patterns often vary across different classes. For example, in the medical field, patients with rare diseases would take more examinations than those with common diseases; in the financial field, high-risk customers tend to receive evaluations from more views than ordinary ones. Hence, we often observe that data-rich classes suffer limited views while data-poor classes suffer limited samples. Previous methods would typically fail due to such biased view-missing patterns. This motivates us to delve into a new biased incomplete multi-view learning problem. To this end, we develop a Reliable Incomplete Multi-view Learning (RIML) method. RIML is a simple yet effective learning-free imputation framework that goes beyond the conventional approaches by considering information from all classes, rather than just relying on individual views or within-class samples. Specifically, we utilize an inter-class association matrix that allows data-poor classes to refer the knowledge from data-rich classes. This enables the construction of more reliable view-specific distributions, from which we perform multiple samplings to recover missing views. Additionally, to obtain a reliable multi-view representation for downstream tasks, we develop an enhanced focal loss with a category-aware marginal term to learn a more distinguishable feature space. Experiments on five multi-view datasets demonstrate that RIML significantly outperforms existing methods in both accuracy and robustness.

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Context

Venue
AAAI Conference on Artificial Intelligence
Archive span
1980-2026
Indexed papers
28718
Paper id
626148485434290048