EAAI Journal 2026 Journal Article
Analog circuit test point selection method for fault diagnosis based on deep reinforcement learning
- Haochi Yang
- Xiaodong Liu
- Tianyu Gao
- Jingli Yang
Reliable operation of analog circuits is fundamental to the safety of medical instruments, automotive controllers, and aerospace systems. A prerequisite for effective fault diagnosis is the selection of a compact yet informative set of test nodes, commonly referred to as analog test-point selection (ATPS). Existing optimization- and search-based approaches often exhibit slow convergence and susceptibility to sub-optimal solutions when applied to large-scale circuits. In this study, ATPS is reformulated as a sequential decision-making problem addressed by a Dual-Stream Dueling Deep-Q Network (DS-DDQN). The framework is designed to learn, from simulation data, the most valuable next test node under a user-defined cost constraint. Two types of input are processed: the evolving diagnostic state, representing unresolved fault groups, and the available cost budget. To achieve scalability, raw simulation responses are compressed into compact fault-isolation scores through a Gaussian mixture model, allowing efficient learning even in the presence of extensive fault dictionaries. Experimental evaluations on industry-standard benchmarks and real-world circuits demonstrate improvements in diagnostic accuracy from 3. 94% to 33. 72% and reductions in selection time by nearly an order of magnitude, compared with circuit-level outputs and representative baseline methods.