EAAI Journal 2026 Journal Article
A deformable convolution and shuffle attention enhanced network for surface defect detection
- Yinggan Tang
- Xueguang Lv
- Tong Sun
Steel surface defect detection is vital for industrial quality control but remains challenging due to irregular shapes and complex backgrounds. In this paper, we propose a novel network, named deformable convolution and shuffle attention enhanced network (DSA-Net), to address these challenges. First, we design a Cross-Stage Partial Block with Kernel Size 2 and Deformable Convolution and Shuffle Attention (C3k2-DSA) module that integrates deformable convolution with shuffle attention to adaptively model irregular defect geometries while suppressing background interference, thereby enhancing the focus on critical defect regions. Second, a bidirectional multi-scale feature fusion neck is constructed by combining top-down and bottom-up pathways, enabling effective interaction between fine-grained details and high-level semantic features for accurate multi-scale defect detection. Third, we introduce a Convolutional Block with Large Separable Kernel Attention (C2LSKA) module that combines cross-stage partial connections with large separable kernel attention to efficiently capture long-range dependencies and strengthen multi-scale feature representation. Finally, the Unified Intersection over Union (UIoU) loss function is adopted to dynamically redistribute regression weights, jointly optimizing bounding box overlap, quality awareness, and confidence weighting, thereby improving localization accuracy. Experimental results demonstrate that DSA-Net achieves 81. 0% mean Average Precision (mAP) on Northeastern University surface defect database for detection (NEU-DET), 72. 4% on Metallic Surface Defect Datasets: The new Benchmark (GC10-DET), and 73. 3% on Severstal, outperforming You Only Look Once version 11 small (YOLOv11s) by 5. 3%, 4. 8%, and 8. 3%, respectively. These results confirm the superior accuracy and robustness of the proposed method for steel surface defect detection.