EAAI Journal 2026 Journal Article
A lightweight framework with adaptive feature enhancement for accurate pavement distress evaluation
- Yi Liang
- Jueqiang Tao
- Qing Yang
- Xin Qiu
- Tingfeng Zhang
- Yafang Liu
- Heng Zhou
Timely pavement condition survey ensures optimal pavement performance and extends its service life. However, existing lightweight object detection models for pavement distress identification often struggle with a trade-off between computational efficiency and fine-grained feature extraction, fail to adapt to the irregular, elongated morphologies of cracks using fixed-grid convolutions, and are hindered by class imbalance and complex backgrounds that lead to misclassifications. To address these gaps, this study proposes the Lightweight Pavement Distress Network (LPD-Net), a crack-feature enhanced framework based on You Only Look Once version 11 (YOLOv11) for accurate pavement distress detection. Firstly, a large-scale dataset comprising depth images was constructed using a three-dimensional (3D) laser imaging sensor. Secondly, Dynamic Snake Convolution (DySConv) was integrated into the Cross Stage Partial with kernel size 2 (C3k2) module to adaptively adjust kernel sampling for better capturing crack contours and edges. Thirdly, a Bi-level Routing Attention (BRA) module was embedded to dynamically filter background noise and focus on sparse distress features, alleviating class imbalance. Lastly, a Lightweight Asymmetric Detection Head (LADH) incorporating Depthwise Separable Convolution (DSConv) was designed to reduce computational overhead while maintaining localization precision. Experimental results demonstrate that LPD-Net achieves a superior balance, reducing computational cost by 15. 9 % to 5. 3 Giga Floating Point Operations (GFLOPs) compared to the baseline while increasing mean Average Precision at 50 % intersection over union (mAP@50) by 6. 5 % to 0. 506. Measurement-oriented evaluation via Pavement Condition Index (PCI) further confirms its reliability, with 40. 72 % agreement within ± 5 PCI, aligning well with metrological standards.