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Jiafeng Li

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2 papers

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AAAI Conference 2025 Conference Paper

M²RL-Net: Multi-View and Multi-Level Relation Learning Network for Weakly-Supervised Image Forgery Detection

Jiafeng Li
Ying Wen
Lianghua He

As digital media manipulation becomes increasingly sophisticated, accurately detecting and localizing image forgeries with minimal supervision has become a critical challenge. Existing weakly supervised image forgery detection (W-IFD) methods often rely on convolutional neural networks (CNNs) and limited exploration of internal relationships, leading to poor detection and localization performance with only image-level labels. To address these limitations, we introduce a novel Multi-View and Multi-Level Relation Learning Network (M²RL-Net) for W-IFD. M²RL-Net effectively identifies forged images using only image-level annotations by exploring relationships between different views and hierarchical levels within images. Specifically, M²RL-Net achieves patch-level self-consistency learning (PSL) and feature-level contrastive learning (FCL) across different views, facilitating more generalized self-supervised learning of forgery features. In detail, PSL employs self-supervised learning to distinguish consistent and inconsistent regions within images, enhancing its ability to accurately locate tampered areas. FCL utilizes feature-level self-view and multi-view contrastive learning to differentiate between genuine and tampered image features, thereby improving the recognition of authentic and manipulated content across different views. Extensive experiments on various datasets demonstrate that M²RL-Net outperforms existing weakly-supervised methods in both detection and localization accuracy. This research sets a new benchmark for weakly-supervised image forgery detection and lays a robust foundation for future studies in this field.

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AAAI Conference 2024 Conference Paper

EAN: An Efficient Attention Module Guided by Normalization for Deep Neural Networks

Jiafeng Li
Zelin Li
Ying Wen

Deep neural networks (DNNs) have achieved remarkable success in various fields, and two powerful techniques, feature normalization and attention mechanisms, have been widely used to enhance model performance. However, they are usually considered as two separate approaches or combined in a simplistic manner. In this paper, we investigate the intrinsic relationship between feature normalization and attention mechanisms and propose an Efficient Attention module guided by Normalization, dubbed EAN. Instead of using costly fully-connected layers for attention learning, EAN leverages the strengths of feature normalization and incorporates an Attention Generation (AG) unit to re-calibrate features. The proposed AG unit exploits the normalization component as a measure of the importance of distinct features and generates an attention mask using GroupNorm, L2 Norm, and Adaptation operations. By employing a grouping, AG unit and aggregation strategy, EAN is established, offering a unified module that harnesses the advantages of both normalization and attention, while maintaining minimal computational overhead. Furthermore, EAN serves as a plug-and-play module that can be seamlessly integrated with classic backbone architectures. Extensive quantitative evaluations on various visual tasks demonstrate that EAN achieves highly competitive performance compared to the current state-of-the-art attention methods while sustaining lower model complexity.

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