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Jackson Gorham

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5 papers

2 author rows

NeurIPS Conference 2020 Conference Paper

Stochastic Stein Discrepancies

Jackson Gorham
Anant Raj
Lester Mackey

Stein discrepancies (SDs) monitor convergence and non-convergence in approximate inference when exact integration and sampling are intractable. However, the computation of a Stein discrepancy can be prohibitive if the Stein operator -- often a sum over likelihood terms or potentials -- is expensive to evaluate. To address this deficiency, we show that stochastic Stein discrepancies (SSDs) based on subsampled approximations of the Stein operator inherit the convergence control properties of standard SDs with probability 1. Along the way, we establish the convergence of Stein variational gradient descent (SVGD) on unbounded domains, resolving an open question of Liu (2017). In our experiments with biased Markov chain Monte Carlo (MCMC) hyperparameter tuning, approximate MCMC sampler selection, and stochastic SVGD, SSDs deliver comparable inferences to standard SDs with orders of magnitude fewer likelihood evaluations.

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ICML Conference 2019 Conference Paper

Stein Point Markov Chain Monte Carlo

Wilson Ye Chen
Alessandro Barp
François-Xavier Briol
Jackson Gorham
Mark A. Girolami
Lester W. Mackey
Chris J. Oates

An important task in machine learning and statistics is the approximation of a probability measure by an empirical measure supported on a discrete point set. Stein Points are a class of algorithms for this task, which proceed by sequentially minimising a Stein discrepancy between the empirical measure and the target and, hence, require the solution of a non-convex optimisation problem to obtain each new point. This paper removes the need to solve this optimisation problem by, instead, selecting each new point based on a Markov chain sample path. This significantly reduces the computational cost of Stein Points and leads to a suite of algorithms that are straightforward to implement. The new algorithms are illustrated on a set of challenging Bayesian inference problems, and rigorous theoretical guarantees of consistency are established.

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ICML Conference 2018 Conference Paper

Stein Points

Wilson Ye Chen
Lester W. Mackey
Jackson Gorham
François-Xavier Briol
Chris J. Oates

An important task in computational statistics and machine learning is to approximate a posterior distribution $p(x)$ with an empirical measure supported on a set of representative points $\{x_i\}_{i=1}^n$. This paper focuses on methods where the selection of points is essentially deterministic, with an emphasis on achieving accurate approximation when $n$ is small. To this end, we present Stein Points. The idea is to exploit either a greedy or a conditional gradient method to iteratively minimise a kernel Stein discrepancy between the empirical measure and $p(x)$. Our empirical results demonstrate that Stein Points enable accurate approximation of the posterior at modest computational cost. In addition, theoretical results are provided to establish convergence of the method.

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ICML Conference 2017 Conference Paper

Measuring Sample Quality with Kernels

Jackson Gorham
Lester W. Mackey

Approximate Markov chain Monte Carlo (MCMC) offers the promise of more rapid sampling at the cost of more biased inference. Since standard MCMC diagnostics fail to detect these biases, researchers have developed computable Stein discrepancy measures that provably determine the convergence of a sample to its target distribution. This approach was recently combined with the theory of reproducing kernels to define a closed-form kernel Stein discrepancy (KSD) computable by summing kernel evaluations across pairs of sample points. We develop a theory of weak convergence for KSDs based on Stein’s method, demonstrate that commonly used KSDs fail to detect non-convergence even for Gaussian targets, and show that kernels with slowly decaying tails provably determine convergence for a large class of target distributions. The resulting convergence-determining KSDs are suitable for comparing biased, exact, and deterministic sample sequences and simpler to compute and parallelize than alternative Stein discrepancies. We use our tools to compare biased samplers, select sampler hyperparameters, and improve upon existing KSD approaches to one-sample hypothesis testing and sample quality improvement.

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NeurIPS Conference 2015 Conference Paper

Measuring Sample Quality with Stein's Method

Jackson Gorham
Lester Mackey

To improve the efficiency of Monte Carlo estimation, practitioners are turning to biased Markov chain Monte Carlo procedures that trade off asymptotic exactness for computational speed. The reasoning is sound: a reduction in variance due to more rapid sampling can outweigh the bias introduced. However, the inexactness creates new challenges for sampler and parameter selection, since standard measures of sample quality like effective sample size do not account for asymptotic bias. To address these challenges, we introduce a new computable quality measure based on Stein's method that bounds the discrepancy between sample and target expectations over a large class of test functions. We use our tool to compare exact, biased, and deterministic sample sequences and illustrate applications to hyperparameter selection, convergence rate assessment, and quantifying bias-variance tradeoffs in posterior inference.

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